@prefix jvr: <http://data.loterre.fr/ark:/67375/JVR> .
@prefix skos: <http://www.w3.org/2004/02/skos/core#> .
@prefix mesh: <http://id.nlm.nih.gov/mesh/vocab#> .
@prefix dc: <http://purl.org/dc/terms/> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .
@prefix owl: <http://www.w3.org/2002/07/owl#> .

jvr:-WVZ61GT7-0
  skos:prefLabel "tendances (Qualificatif)"@fr, "trends (Qualifier)"@en ;
  a mesh:Qualifier, skos:Concept .

jvr:-GK84Q7RM-F
  skos:prefLabel "Microscopy, Electron, Transmission"@en, "Microscopie électronique à transmission"@fr ;
  a mesh:Descriptor, skos:Concept ;
  skos:broader jvr:-TNJWJ95F-G .

jvr:-KFM33PF8-L
  skos:prefLabel "médecine vétérinaire (Qualificatif)"@fr, "veterinary (Qualifier)"@en ;
  a mesh:Qualifier, skos:Concept .

jvr:-TNJWJ95F-G
  mesh:allowableQualifier jvr:-WJSMRGQV-L, jvr:-GX844VQL-G, jvr:-R3QWLHRG-V, jvr:-PPKJKFKK-V, jvr:-CB30NGKB-3, jvr:-SBNWSM1T-R, jvr:-KFM33PF8-L, jvr:-K3JH4VF9-N, jvr:-WVZ61GT7-0, jvr:-W6SQV79N-S ;
  skos:narrower jvr:-JG1ZWDKH-9, jvr:-GK84Q7RM-F, jvr:-V88F3ZBD-R, jvr:-GX7DZ03J-F, jvr:-C7NLJT5N-D ;
  skos:definition "Microscopy using an electron beam, instead of light, to visualize the sample, thereby allowing much greater magnification. The interactions of ELECTRONS with specimens are used to provide information about the fine structure of that specimen. In TRANSMISSION ELECTRON MICROSCOPY the reactions of the electrons that are transmitted through the specimen are imaged. In SCANNING ELECTRON MICROSCOPY an electron beam falls at a non-normal angle on the specimen and the image is derived from the reactions occurring above the plane of the specimen."@en ;
  dc:established "1966-01-01"^^xsd:date ;
  a mesh:Descriptor, skos:Concept ;
  dc:created "1999-01-01"^^xsd:date ;
  skos:altLabel "Electron Microscopy"@en ;
  owl:sameAs <http://id.nlm.nih.gov/mesh/D008854> ;
  dc:modified "2004-07-28"^^xsd:date ;
  skos:prefLabel "Microscopie électronique"@fr, "Microscopy, Electron"@en ;
  skos:inScheme jvr: ;
  skos:broader jvr:-QQHLMHQT-2 .

jvr:-QQHLMHQT-2
  skos:prefLabel "Microscopie"@fr, "Microscopy"@en ;
  a mesh:Descriptor, skos:Concept ;
  skos:narrower jvr:-TNJWJ95F-G .

jvr:-GX844VQL-G
  skos:prefLabel "instrumentation (Qualifier)"@en, "instrumentation (Qualificatif)"@fr ;
  a mesh:Qualifier, skos:Concept .

jvr:-PPKJKFKK-V
  skos:prefLabel "ethics (Qualifier)"@en, "éthique (Qualificatif)"@fr ;
  a mesh:Qualifier, skos:Concept .

jvr:-WJSMRGQV-L
  skos:prefLabel "statistiques et données numériques (Qualificatif)"@fr, "statistics & numerical data (Qualifier)"@en ;
  a mesh:Qualifier, skos:Concept .

jvr:-C7NLJT5N-D
  skos:prefLabel "Microscopy, Immunoelectron"@en, "Microscopie immunoélectronique"@fr ;
  a mesh:Descriptor, skos:Concept ;
  skos:broader jvr:-TNJWJ95F-G .

jvr:-W6SQV79N-S
  skos:prefLabel "classification (Qualifier)"@en, "classification (Qualificatif)"@fr ;
  a mesh:Qualifier, skos:Concept .

jvr:-CB30NGKB-3
  skos:prefLabel "economics (Qualifier)"@en, "économie (Qualificatif)"@fr ;
  a mesh:Qualifier, skos:Concept .

jvr: a skos:ConceptScheme .
jvr:-SBNWSM1T-R
  skos:prefLabel "history (Qualifier)"@en, "histoire (Qualificatif)"@fr ;
  a mesh:Qualifier, skos:Concept .

jvr:-JG1ZWDKH-9
  skos:prefLabel "Cryoelectron Microscopy"@en, "Cryomicroscopie électronique"@fr ;
  a mesh:Descriptor, skos:Concept ;
  skos:broader jvr:-TNJWJ95F-G .

jvr:-R3QWLHRG-V
  skos:prefLabel "standards (Qualifier)"@en, "normes (Qualificatif)"@fr ;
  a mesh:Qualifier, skos:Concept .

jvr:-V88F3ZBD-R
  skos:prefLabel "Electron Probe Microanalysis"@en, "Microanalyse par sonde électronique"@fr ;
  a mesh:Descriptor, skos:Concept ;
  skos:broader jvr:-TNJWJ95F-G .

jvr:-GX7DZ03J-F
  skos:prefLabel "Microscopy, Electron, Scanning"@en, "Microscopie électronique à balayage"@fr ;
  a mesh:Descriptor, skos:Concept ;
  skos:broader jvr:-TNJWJ95F-G .

jvr:-K3JH4VF9-N
  skos:prefLabel "methods (Qualifier)"@en, "méthodes (Qualificatif)"@fr ;
  a mesh:Qualifier, skos:Concept .