@prefix jvr: <http://data.loterre.fr/ark:/67375/JVR> .
@prefix skos: <http://www.w3.org/2004/02/skos/core#> .
@prefix mesh: <http://id.nlm.nih.gov/mesh/vocab#> .
@prefix dc: <http://purl.org/dc/terms/> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .
@prefix owl: <http://www.w3.org/2002/07/owl#> .

jvr:-CB30NGKB-3
  skos:prefLabel "economics (Qualifier)"@en, "économie (Qualificatif)"@fr ;
  a mesh:Qualifier, skos:Concept .

jvr:-W6SQV79N-S
  skos:prefLabel "classification (Qualifier)"@en, "classification (Qualificatif)"@fr ;
  a mesh:Qualifier, skos:Concept .

jvr:-WVZ61GT7-0
  skos:prefLabel "tendances (Qualificatif)"@fr, "trends (Qualifier)"@en ;
  a mesh:Qualifier, skos:Concept .

jvr:-V87FT3F2-5
  skos:prefLabel "Mass Spectrometry"@en, "Spectrométrie de masse"@fr ;
  a mesh:Descriptor, skos:Concept ;
  skos:narrower jvr:-RNLS930Q-2 .

jvr:-PPKJKFKK-V
  skos:prefLabel "ethics (Qualifier)"@en, "éthique (Qualificatif)"@fr ;
  a mesh:Qualifier, skos:Concept .

jvr:-SBNWSM1T-R
  skos:prefLabel "history (Qualifier)"@en, "histoire (Qualificatif)"@fr ;
  a mesh:Qualifier, skos:Concept .

jvr:-WJSMRGQV-L
  skos:prefLabel "statistiques et données numériques (Qualificatif)"@fr, "statistics & numerical data (Qualifier)"@en ;
  a mesh:Qualifier, skos:Concept .

jvr:-GX844VQL-G
  skos:prefLabel "instrumentation (Qualifier)"@en, "instrumentation (Qualificatif)"@fr ;
  a mesh:Qualifier, skos:Concept .

jvr:-K3JH4VF9-N
  skos:prefLabel "methods (Qualifier)"@en, "méthodes (Qualificatif)"@fr ;
  a mesh:Qualifier, skos:Concept .

jvr: a skos:ConceptScheme .
jvr:-R3QWLHRG-V
  skos:prefLabel "standards (Qualifier)"@en, "normes (Qualificatif)"@fr ;
  a mesh:Qualifier, skos:Concept .

jvr:-KFM33PF8-L
  skos:prefLabel "médecine vétérinaire (Qualificatif)"@fr, "veterinary (Qualifier)"@en ;
  a mesh:Qualifier, skos:Concept .

jvr:-RNLS930Q-2
  skos:broader jvr:-V87FT3F2-5 ;
  dc:established "1995-01-01"^^xsd:date ;
  skos:altLabel "Spectroscopy, Mass, Secondary Ion"@en, "Spectroscopie de masse à ionisation secondaire"@fr, "Mass Spectrometry, Secondary Ion"@en, "Spectrométrie de masse SIMS"@fr, "Spectroscopie de masse à ions secondaires"@fr, "Secondary Ion Mass Spectroscopy"@en, "Secondary Ion Mass Spectroscopy Microscopy"@en, "Microscopie par spectroscopie de masse d'ions secondaires"@fr, "Mass Spectroscopy, Secondary Ion"@en, "Microscopie par spectrométrie de masse d'ions secondaires"@fr, "Microscopie SIMS"@fr, "Secondary Ion Mass Spectrometry"@en, "Spectroscopie de masse d'ions secondaires"@fr, "Secondary Ion Mass Spectrometry Microscopy"@en, "Spectrométrie de masse à ions secondaires"@fr, "Spectrométrie de masse des ions secondaires"@fr, "SIMS Microscopy"@en, "Spectroscopie de masse des ions secondaires"@fr, "Spectrométrie de masse à ionisation secondaire"@fr, "Spectrométrie de masse SIMS (Secondary Ion Mass Spectrometry)"@fr ;
  mesh:allowableQualifier jvr:-PPKJKFKK-V, jvr:-R3QWLHRG-V, jvr:-GX844VQL-G, jvr:-CB30NGKB-3, jvr:-WJSMRGQV-L, jvr:-SBNWSM1T-R, jvr:-W6SQV79N-S, jvr:-WVZ61GT7-0, jvr:-KFM33PF8-L, jvr:-K3JH4VF9-N ;
  a skos:Concept, mesh:Descriptor ;
  owl:sameAs <http://id.nlm.nih.gov/mesh/D018629> ;
  skos:definition "A mass-spectrometric technique that is used for microscopic chemical analysis. A beam of primary ions with an energy of 5-20 kiloelectronvolts (keV) bombards a small spot on the surface of the sample under ultra-high vacuum conditions. Positive and negative secondary ions sputtered from the surface are analyzed in a mass spectrometer in regards to their mass-to-charge ratio. Digital imaging can be generated from the secondary ion beams and their intensity can be measured. Ionic images can be correlated with images from light or other microscopy providing useful tools in the study of molecular and drug actions."@en ;
  skos:prefLabel "Spectrometry, Mass, Secondary Ion"@en, "Spectrométrie de masse d'ions secondaires"@fr ;
  skos:inScheme jvr: ;
  dc:modified "2006-07-05"^^xsd:date ;
  dc:created "1994-05-12"^^xsd:date .