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Concept information

... > Diagnosis > Diagnostic Techniques and Procedures > Diagnostic Imaging > Microscopy > Microscopy, Electron > Microscopy, Electron, Scanning
Investigative Techniques > Microscopy > Microscopy, Electron > Microscopy, Electron, Scanning
... > Natural Science Disciplines > Physics > Optics and Photonics > Microscopy > Microscopy, Electron > Microscopy, Electron, Scanning
... > Technology, Industry, and Agriculture > Engineering > Optics and Photonics > Microscopy > Microscopy, Electron > Microscopy, Electron, Scanning

Terme préférentiel

Microscopy, Electron, Scanning  

Type

  • mesh:Descriptor

Définition

  • Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY.

Concept générique

Concepts associés

Synonyme(s)

  • Electron Scanning Microscopy
  • Scanning Electron Microscopy

Qualificatif(s) autorisé(s)

Traductions

URI

http://data.loterre.fr/ark:/67375/JVR-GX7DZ03J-F

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RDF/XML TURTLE JSON-LD Date de création 01/01/1999, dernière modification le 08/02/2016